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CBR1000 Series Roughness Measuring Instrument

Item No.:



Description Item specifics
Features: 
Desk structure standard model, lower cost.
Equipped with standard no guide head roughness detector.
Hundreds of parameters can be evaluated such as roughness, waviness, contour,etc.


Technical Specification:
Model No. CBR1000 CBR2000
Column Range 320 ~ 620 mm  
Drive unit Range 100 ~ 200 mm  
Indicating accuracy[1] ± (1+2L/100) μm ± (0.8+2L/100) μm
Detector Range ± 300 μm ± 500 μm
Range resolution ratio 1:65536 1:262144
Indicating accuracy[1] ≤ ± (7nm+ 3.5%) ≤ ± (5nm+ 3.5%)
Repeatability[2] 1σ≤2 nm 1σ≤1 nm
Accuracy Residual noise[3] ≤ 10 nm ≤ 5 nm
Drive Speed X axis (horizontal direction) 0.1 ~ 10 mm/s 0.05 ~ 15 mm/s
Z axis (column) 0.5 ~ 10 mm/s 0.2 ~ 15 mm/s
Roughness Measurement Function Roughness Function:
Ra, Rp, Rv, Rz, Rz(jis), R3z, RzDIN, Rzj, Rmax, Rc, Rt, Rq, Rsk, Rku, Rsm,Rs, R△q, Rk, Rpk, Rvk, Mr1, Mr2, Rmr
Waveness Parameter:
Wa, Wt, Wp, Wv, Wz, Wq, Wsm, Wsk, Wku, Wmr
Original Contour Parameter:
Pa, Pt, Pp, Pv, Pz, Pq, Psm, Psk, Pku, Pmr
[1]:  (L: measuring length)
[2]:  (measuring with square wave standard gauge block, Ra is 0.35 ~ 0.5μm.)
[3]:  (λc is 0.08mm, optical flat sampling speed 0.1mm/s.)


Application:

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