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FD Series

High Precision Contour Measuring Instrument

Surface contour measurement,for higher precision

High Precision Contour Measuring Instrument
Surface Topography Measuring Instrument
Surface Topography Measuring Instrument
High Precision Contour Measuring InstrumentFD Series

In the field of precision manufacturing, traditional dimensional measurement can no longer meet the stringent quality requirements of modern industry. 

The conventional dimensional measurement only can reflect geometric tolerances of workpiece and it struggles to sample the critical impact influence of surface microscopic profile to workpiece performance.

FD series contour measuring instrument breaks through the limitations of traditional measurement, special built for high precision workpiece microscopic contour analysis. It adopts advanced contact method detector technology, can make exceptional precision nanoscale to micron order surface features measurement.

Technical SpecificationPRODUCT PARAMETERS
ModelFD 1800FD 2200
Measure rangeX-axis180 mm220 mm
Z-axis420 mm620 mm
Z1-axis40 mm60 mm
ResolutionX-axis1.2 nm1.2 nm
Z1-axis1.2 nm1.2 nm
Coutour accuracyZ1-axis linearity accuracy≤±(0.5+|0.02H|) um≤±(0.5+|0.02H|) um
Arc≤±(1+R/12) μm≤±(1+R/12) μm
Arc Pt≤0.3 um≤0.3 um
Angle±1′±1′
Straightness≤0.3 um / 100 mm (cut-off 0.8)≤0.3 um / 100 mm (cut-off 0.8)
Motion controlX-axis drive wayBy electricBy electric
Z-axis drive wayBy electricBy electric
Measure speed0.1-2 mm/s0.1-2 mm/s
Granite table500x800 mm
Applications Measurement case
Contour Instrument Measurement Cases
Contour Instrument Measurement Cases
Contour Instrument Measurement Cases
Contour Instrument Measurement Cases

Precision Measurement Solution Provider

Understand customer and industry requirements,
provide custom tailored measurement solutions.

Email:ethan@walechina.com

Add:No.29 Shanglinyuan 3rd Road,Hi-tech Zone,Xi'an,China,710075

Tel:+86-158 2903 5092

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