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CER Series

Contour Roughness Measuring Instrument

Independent dual detectors, maximize performance to full potential.

Contour Roughness Measuring Instrument
Roughness contour composited measuring instrument
Contour Roughness Measuring InstrumentCER Series

Built on an innovative independent dual detectors design, ensuring each detector can perform unique advantages through precise coordination and optimized configuration, promoting complementarity performance between detectors, and bringing users a best experience.

The ingenious mechanical structure design makes it simple and convenient for contour detector and roughness detector changes.

Technical SpecificationPRODUCT PARAMETERS
ModelCER 1340FCER 1440F
Measure RangeX-axis120 mm150 mm
Z-axis420 mm420 mm
Z1-axisContour 30 mmContour 40 mm
Roughness ±420 μmRoughness ±420 μm
ResolutionX-axis0.1 μm0.1 μm
Z1-axis0.02 μm0.02 μm
Z1-axis65536:165536:1
Coutour AccuracyZ1-axis linearity accuracy≤±(0.8+|0.05H|) um≤±(0.8+|0.05H|) um
Arc≤±(2+R/8) μm≤±(2+R/8) μm
Angle±2′±2′
Straightness≤0.5 um / 100 mm (cut-off 2.5)≤0.5 um / 100 mm (cut-off 2.5)
Roughness accuracyIndicating accuracy≤±(10 nm+3.5%)≤±(10 nm+3.5%)
Residual noise≤0.01 μm≤0.01 μm
Repeatability1δ≤2 nm1δ≤2 nm
Cut-off0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8mm0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8mm
Evaluation lengthλc x 2 / 3 / 4 / 5 / 6 / 7λc x 2 / 3 / 4 / 5 / 6 / 7
Motion ControlX-axis drive wayBy electricBy electric
Z-axis drive wayBy electricBy electric
Contour measure speed0.1-0.5mm/s0.1-0.5mm/s
Roughness measure speed0.05-0.5mm/s0.05-0.5mm/s

Precision Measurement Solution Provider

Understand customer and industry requirements,
provide custom tailored measurement solutions.

Email:ethan@walechina.com

Add:No.29 Shanglinyuan 3rd Road,Hi-tech Zone,Xi'an,China,710075

Tel:+86 158 2903 5092

COPYRIGHT ©2025 WALE
COPYRIGHT ©2025 WALE