Exceptional stability structure
The drive unit adopts innovative integrated casting design, enhancing structural integrity. Combined with high rigidity granite column, the instrument delivers superior vibration isolation capacity, reducing influence of external vibration on measurement results, ensuring instrument long term measurement accuracy and extending work life.
Nanoscale high precision detector
Both the X axis and the detector achieve a resolution of 1.2 nm, leading instrument to high accuracy level. This enables precise sampling the difference between profile detail and roughness on workpiece surface, ensuring reliable data for high end metrology applications.
One measurement full parameters comprehensive evaluation
With Profile Tracer 4.0 measuring software system, the surface dimensions, profile, waviness and roughness can be measured and evaluated from one measurement, the result report can be generated automatically, enhancing measurement efficiency significantly.
